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A Scanning Electrochemical Microscopy Module for Commercial AFM Systems: AFM-SECM for Simultaneous Topography and Electrochemical Imaging

Wednesday, October 30, 2013: 16:40
Franciscan C, Tower 1, Ballroom Level (Hilton San Francisco Union Square)
Shijie Wu, PhD , Agilent Technologies, Inc, Chandler, AZ
Christine Kranz, PhD , University of Ulm

Abstract:

See more of: A2 Wednesday Afternoon Session
See more of: A2: Nanotechnology General Session
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