904
In-Situ Observation of Single Silicon Particle During Charging and Discharging

Tuesday, October 29, 2013: 09:00
Golden Gate 6, Tower 3, Lobby Level (Hilton San Francisco Union Square)
Kei Nishikawa , National Institute for Materials Science, Tsukuba, Japan
Hirokazu Munakata , Tokyo Metropolitan University
Kiyoshi Kanamura , National Institute for Materials Science, Tokyo, Japan

Abstract:

  • B9-0904 (1028.8KB) - Abstract Text
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