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Analysis of Voltage Depression Mechanism After Charge-Discharge Cycling Tests for Li and Mn-Rich Cathode Materials

Monday, October 28, 2013: 10:20
Continental 5, Tower 3, Ballroom Level (Hilton San Francisco Union Square)
Yoshihiro Kadoma, Research Associate , Iwate University, Morioka, Japan
Akari Matsutomo , Iwate University
Hisashi Watanabe , Iwate University
Yuki Takei , Samsung R&D Institute Japan
Keisuke Nomura , Samsung R&D Institute Japan
Masatsugu Nakano , Samsung R&D Institute Japan
Koichi Ui, Associate Professor , Iwate University

Abstract:

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