1790
Surface Oxide films : Growth, Chemical Composition, Structure Investigated By Surface Analytical Techniques (XPS, ToF-SIMS, STM, STS) and Recent Progress in Modeling

Monday, October 28, 2013: 10:10
Golden Gate 2, Tower 3, Lobby Level (Hilton San Francisco Union Square)
Philippe Marcus, PhD , CNRS (UMR 7045)/Chimie ParisTech, Paris, France

Abstract:

See more of: Honoring Professor Clayton
See more of: D5: Oxide Films: A Symposium in Honor of Clive Clayton on his 65th Birthday
See more of: Corrosion, Passivation, and Anodic Films
<< Previous Abstract | Next Abstract >>