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Carbon Nanotube Coated Paper Sensor for Damage Diagnosis Using Electrical Impedance Tomography

Tuesday, October 29, 2013: 09:20
Franciscan B, Tower 1, Ballroom Level (Hilton San Francisco Union Square)
Beomseok Kim , ELORET Corporation at NASA Ames Research Center, Moffett Field, CA
Yijiang Lu , ELORET Corporation at NASA Ames Research Center
Taemin Kim , SGT at NASA Ames Research Center
Jin-woo Han , USRA at NASA Ames Research Center
Meyya Meyyappan, PhD , NASA Ames Research Center
Jing Li , NASA Ames Research Center

Abstract:

See more of: Impedance Techniques, Diagnostics, and Sensing Applications - Theory, Techniques, and Instrumentation
See more of: J2: Impedance Techniques, Diagnostics, and Sensing Applications
See more of: Sensors and Displays: Principles, Materials, and Processing
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