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Nickel Migration in SOFCs Anode Due to Phosphine Induced Degradation: A Computational Study
Nickel Migration in SOFCs Anode Due to Phosphine Induced Degradation: A Computational Study
Thursday, October 31, 2013: 08:20
Continental 4, Tower 3, Ballroom Level (Hilton San Francisco Union Square)
Abstract:
- B1-0343 (7.6KB) - Abstract Text