2280
In Situ Stress and Nanogravimetric Measurements During De-Alloying of PtCu Thin-Film Electrode

Wednesday, October 30, 2013: 11:00
Golden Gate 7, Tower 3, Lobby Level (Hilton San Francisco Union Square)
Vijay A. Sethuraman , Brown University, Providence, RI
Deepa Vairavapandian , Brown University
Manon C. Lafouresse , National Institute of Standards and Technology, Gaithersburg, MD
Naba Karan , Brown University
Shouheng Sun , Brown University
Ugo Bertocci , National Institute of Standards and Technology
Gery R. Stafford , National Institute of Standards and Technology
Pradeep Guduru , Brown University

Abstract:

See more of: Catalyst 2 - Challenging
See more of: F2: Emerging Materials and Processes for Energy Conversion and Storage
See more of: Electrochemical/Chemical Deposition and Etching
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