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Electrochemical Capacitance-Voltage Technique To Characterize Doping Profiles Of Silicon Nanowires Grown By Electroless Etching

Tuesday, October 29, 2013
Grand Ballroom, Tower 2, Grand Ballroom Level (Hilton San Francisco Union Square)
Victor H. Velez, MS , University of Central Florida, Orlando, FL
Robert George Mertens, Ph.D. , University of Central Florida, Deltona, FL
Kalpathy B Sundaram , Univ. of Central Florida

Abstract: