1303
Structure-to-Property Relationships in Non-Platinum Group Fuel Cell Catalysts at the Mesoscale
There is a complex interplay between different chemical moieties and morphology on various length scales. The length-scales of pores and surface roughness determine the types and efficiency of diffusion that allow fuel to be delivered to the active sites and removal of the products.(1) The length-scales of surface features also plays a role in the wettability of the surface (2) and may be related to the formation of the active sites in non-PGM catalysts.(3)
This work focuses on examination of surface features from the mesoscale to the macroscale using wavelet analysis of SEM and AFM micrographs. The technique used to elucidate the length-scales of surface features is the wavelet transform. Previous work using wavelet decompositions for image analysis have used the wavelet shape that has the lowest entropy or that gives the best ‘looking’ image decomposition. It is also common to take the mathematically calculated size of the wavelet to be representative of the physical features it models. We have empirically examined many wavelet shapes to determine which yields the most reliable correlation between wavelet detail output and physical feature size in SEM images. These size correlations are presented, and correlations between analyzed wavelet decompositions and measured physical properties including chemistry and performance are presented. The relationships between wavelet details in SEM and AFM images have also been explored.
Catalysts examined were synthesized from various precursors including aminoantipyrine, carbendazim, and nicarbazin.(4, 5) Several model systems were also examined including Au nanospheres, graphenes, and graphene oxides. Comparison of wavelet decompositions of SEM and AFM micrographs of selected catalyst and model systems is shown in Figure 1. Though the magnitude of the roughness is different between the SEM and AFM images, the trend is the same. Quantitative comparison of the roughness measured by SEM and AFM demonstrates that SEM micrographs are representative of the roughness of a surface.
References
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3. S.-I. Pyun and C.-K. Rhee, Electrochim Acta, 49, 4171 (2004).
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5. A. Serov, K. Artyushkova and P. Atanassov, Adv. Energy Materials accepted (2014).