Scanning Kelvin Probe Force Microscopy as Tool for the Investigation of Localized Corrosion

Wednesday, 8 October 2014: 08:00
Expo Center, 1st Floor, Universal 11 (Moon Palace Resort)
M. Rohwerder (Christian Doppler Laboratory for Diffusion and Segregation)
In this presentation it will be shown that the Scanning Kelvin Probe Force Microscopy (SKPFM) is a powerful tool for the characterization of corrosion processes at the microscopic level, especially underneath organic coatings, see e.g. [1-3], but also on the uncoated surface, see e.g. [4].

Recently it was developed also to detect hydrogen activity in metal alloys at high resolution and sensitivity and [5-7] and it will be shown that it thus can be applied for the investigation also of hydrogen induced corrosion phenomena.

[1] M. Rohwerder, E. Hornung, M. Stratmann, Electrochim. Acta 48 (2003) 1235

[2] C. Senöz, M. Rohwerder, Electrochim. Acta   56 (2011)   9588

[3] C. Senöz, S. Borodin, M. Stratmann, M. Rohwerder, Corros. Sci. 58 (2012) 307

[4] D.B. Blucher, J.E. Svensson, L.G. Johansson, M. Rohwerder, M. Stratmann, J. Electrochem. Soc. 151 (2004) B621

[5] C. Senöz, S. Evers, M. Stratmann and M. Rohwerder, Electrochem. Commun. 13 (2012)1542

[6] S. Evers, M. Rohwerder, Electrochem. Commun. 24 (2012)  85

[7] S. Evers, S. Ceylan, M. Rohwerder, Science and Technology of Advanced Materials 14 (2013) 014201