Scanning Kelvin Probe Force Microscopy as Tool for the Investigation of Localized Corrosion

In this presentation it will be shown that the Scanning Kelvin Probe Force Microscopy (SKPFM) is a powerful tool for the characterization of corrosion processes at the microscopic level, especially underneath organic coatings, see e.g. [1-3], but also on the uncoated surface, see e.g. [4].

Recently it was developed also to detect hydrogen activity in metal alloys at high resolution and sensitivity and [5-7] and it will be shown that it thus can be applied for the investigation also of hydrogen induced corrosion phenomena.

[1] M. Rohwerder, E. Hornung, M. Stratmann, Electrochim. Acta 48 (2003) 1235

[2] C. Senöz, M. Rohwerder, Electrochim. Acta   56 (2011)   9588

[3] C. Senöz, S. Borodin, M. Stratmann, M. Rohwerder, Corros. Sci. 58 (2012) 307

[4] D.B. Blucher, J.E. Svensson, L.G. Johansson, M. Rohwerder, M. Stratmann, J. Electrochem. Soc. 151 (2004) B621

[5] C. Senöz, S. Evers, M. Stratmann and M. Rohwerder, Electrochem. Commun. 13 (2012)1542

[6] S. Evers, M. Rohwerder, Electrochem. Commun. 24 (2012)  85

[7] S. Evers, S. Ceylan, M. Rohwerder, Science and Technology of Advanced Materials 14 (2013) 014201