Investigation of CdS Thin Films Deposition by the SILAR Method Using Cd(II) Organic Salt as Precursor
The morphology and composition of CdS thin films were characterized using Field-Emission Scanning Electron Microscopy, Energy Dispersive X-ray Spectroscopy and X-ray Photoelectron Spectroscopy. The optical properties of CdS thin films deposited on the glass sheets were investigated by measuring optical absorbance in the wavelength range 300 to 800 nm.
The thin CdS films having a crystalline structure with CdS particles of ca. 20-80 nm in size were deposited on the glass sheet by the SILAR method. The data of optical properties of CdS films deposited with different thickness are compared and presented.
The work was carried out within the project VP1-3.1-ŠMM-08-K-01-009 that is partly supported by the National Programme “An improvement of the skills of researchers” launched by the Lithuanian Ministry of Education and Science.