Electrochemical Characterization of La0.9Sr0.1Ga0.8Mg0.2O3-δ Thin Film Electrolyte Deposited by Radio Frequency Magnetron Sputtering

Wednesday, 8 October 2014: 09:00
Sunrise, 2nd Floor, Galactic Ballroom 5 (Moon Palace Resort)
Y. Endo, T. Terai (School of Engineering, The University of Tokyo), and A. Suzuki (Nuclear Professional School, The University of Tokyo)
Sr and Mg dopoed Lanthunum Gallate (La0.9Sr0.1Ga0.8Mg0.2O3-δ, LSGM) is a well-known electrolyte for solid oxide fuel cell because of the high conductivity. Thin film material can exhibit different characterization from bulk material. Thus, electrochemical characterization of the LSGM thin film electrolyte was measured by impedance spectroscopy in intermediate temperature range under various oxygen partial pressures. In order to prepare the reliable LSGM film, radio frequency magnetron sputtering was used for depositing method. Safire single crystal disk was used as the substrate. As deposited, the film was amorphous. To obtain the crystallized LSGM film, we investigated the influence of the annealing temperature and the heating rate when annealing. By proper post-annealing, crystallized LSGM film was obtained.