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Study of the Chemical and Morphological Characteristics of Al2O3 and HfO2 Surfaces after Immersion in Time-Dependent pH Solutions

Tuesday, 7 October 2014: 15:00
Sunrise, 2nd Floor, Galactic Ballroom 8 (Moon Palace Resort)
J. Molina Reyes and B. M. Perez Ramos (National Institute for Astrophysics, Optics and Electronics)
After immersion of ALD-Al2O3 materials in time-dependent pH solutions (solutions whose pH is changing over time), any possible change in the chemical and morphological characteristics of Al2O3 is correlated to the chemical sensitivity when used as active material in ion-sensitive devices. Morphological changes have been recorded by Atomic Force Microscopy (AFM), while the chemical characteristics have been quantified by Fourier Transform Infrared Spectroscopy (FTIR) and X-ray Photoelectron Spectroscopy (XPS). Experimental results suggest that the changes experienced by the films under immersion are highly dependent on immersion time and ion-strength (acidic or basic solutions), and this might be the main cause of drift in ion-sensitive solid state sensors. Moreover, the data shows that HfO2 and Al2O3 exhibit different chemical characteristics after immersion in pH solutions than Si3N4. Nonetheless, due to their high chemical sensitivity and higher dielectric constant, these materials are well suited for highly sensitive applications in pH-sensing devices.