Impedance Spectroscopy Analysis of Ni/YSZ Interfaces Prepared by Liquid Precursor Deposition
In this work, solution precursor deposited Ni thin films were deposited on dense Zr oxide discs for comparison with Ni-YSZ composite anodes that were prepared by the infiltration of the Ni solution precursor into porous YSZ scaffolds. EIS analysis was carried out, and a transmission line model, which allows the separation of the porous YSZ scaffold ionic resistance and the Ni/YSZ interfacial impedance, was used to fit the impedance data. The dominant impedance arcs in the thin film Ni anodes and the Ni/YSZ interfacial impedance, extracted from the transmission line modelling of the Ni-YSZ composites, both exhibited an activation energy of ~1.3 eV. The same activation energy obtained for the Ni/YSZ interfacial impedance obtained from both Ni thin film anodes and infiltrated Ni-YSZ anodes validates the transmission line fitting approach while the obtained activation energy value of ~1.3 eV indicates that the charge transfer process occurring at the triple phase boundary is the rate determining reaction step in Ni-YSZ anodes.
The authors gratefully acknowledge the Eyes High PDF Program at the University of Calgary and Alberta Innovates – Technology Futures (AITF) for the support of AB, as well as the Natural Sciences and Engineering Research Council of Canada (NSERC) for the overall financial support of this work.
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