1657
Underpotential Deposition of Nickel on Cu2o Films and Its Effects on Reactivity and Stability of Cu2o Films

Tuesday, 31 May 2016: 14:20
Sapphire 410 B (Hilton San Diego Bayfront)
A. Fillinger, K. DeHority, and N. Budin (Ithaca College)
Our studies on crystal facet and reactivity relationship suggest that the (111) face of Cu2O films electrodeposited from pH 12 cupric lactate solution is a preferred surface for photogeneration of H2 from water, owing to its polar O2--termination.  In order to prevent photodecomposition of this Cu2O surface, which is initiated by interaction of the terminal O2- and H+ (Cu2O  + 2H+  + 2e-  --> 2Cu0 + H2O), while maintaining the attraction of H+ to the surface and potentially catalyzing H2 generation, we have attempted to deposit a monolayer of nickel via underpotential deposition (UPD).  Underpotential deposition on oxides has not been explored much unlike the underpotential deposition on metals as a monolayer deposition method.

Nickel was deposited on Cu2O films from a 0.08 M nickel acetate solution by applying various potentials for 1 min at room temperature.  The Cu2O films with nickel deposited were dissolved in HNO3, and then the quantities of the deposited nickel at the various potentials were determined with atomic absorption spectrometry (AAS).  The AAS results indicate that the underpotential deposition at -0.2 V vs. SCE (the calculated Nernst potential of the nickel solution is  -0.49 V vs. SCE) deposited nickel that is equivalent to a 23 % monolayer coverage, corresponding to 60 kJ stronger interaction of Ni2+(aq) with O2- at Cu2O surface than with bulk Ni surface, as predicted for the polar Cu2O (111) face.    For the estimate of the 100 % coverage of Cu2O surface, the atomic radius of Ni (124 pm) was used as well as the surface roughness of 1.09 obtained by atomic force microscopy measurements.  At -0.3 V vs. SCE, more than a monolayer of nickel (205 %) was deposited.

According to the x-ray photoelectron spectroscopy (XPS), the binding energy (BE) of Ni 2p3/2 electron changed from 855 eV for -0.2 V vs. SCE UPD sample to 851 eV for -0.3 V vs. SCE UPD sample.  Since the BEs of 854.6 eV and 852.6 eV have been assigned for Ni2+ and Ni0, respectively, the XPS data indicate that the full reduction of nickel at the Cu2O surface occurs at potentials more negative than -0.2 V vs. SCE. 

The effects of underpotentially deposited nickel on the activity and stability of Cu2O films will be compared with respect to the deposition potential.