Advanced Imaging and Simulation 1

Sunday, 29 May 2016: 13:50-16:00
Sapphire Ballroom E (Hilton San Diego Bayfront)
Chairs:
Wilson K. S. Chiu and Fanglin (Frank) Chen
13:50
Opening Remarks
14:00
(Invited) Multi-Modality X-Ray Imaging at a 10 Nanometer Resolution
Y. S. Chu, H. Yan, X. Huang (Brookhaven National Lab), S. Kalbfleisch (Brookhaven National Laboratory), M. Ge (Brookhaven National Lab), K. Lauer, and E. Nazaretski (Brookhaven National Laboratory)
14:40
(Invited) In Situ TEM Study of Reduction and Reoxidation of NiO and NiO-YSZ Composites
J. Van herle (Ecole Polytechique Fédérale de Lausanne), Q. Jeangros (Ecole Polytechnique Federale de Lausanne), J. B. Wagner (Center for Electron Nanoscopy, DTU), T. W. Hansen (Technical University of Denmark), A. Hessler-Wyser, C. Hébert (Ecole Polytechnique Federale de Lausanne), and R. Dunin-Borkowski (Research Centre Juelich)
15:20
Correlating Laboratory-Based X-Ray and Electron Microscopy to Characterize Defects and Structural Evolution in Solid Oxide Fuel Cells
W. Harris, J. Gelb, S. Kelly, L. Lechner, S. Bhattiprolu, H. Bale (Carl Zeiss X-ray Microscopy), and K. Sasaki (Kyushu University, Next-Generation Fuel Cell Resarch Center)
15:40
Break