In this study selected known SiEI components (i.e., SiO2, Li2Si2O5, Li2SiO3, Li3SiOx, Li2O and LiF) were prepared as amorphous thin films. The chemical composition, homogeneity, morphology and local electronic structure across the surface and the bulk were characterized using X-ray photoelectron spectroscopy (XPS), electron energy loss spectroscopy (EELS), time-of-flight secondary ion mass spectrometry (ToF-SIMS), atomic force microscope (AFM), and scanning-spreading resistance microscopy (SSRM). In addition, the physical, electrochemical and mechanical properties of individual constituents were characterized using electrochemical impedance spectroscopy (EIS), operandoXPS with an electron gun, and AFM (force distance curve) and scanning probe microscopy (SPM)-based nanoindentation.
This study delineates the components which are critical for stabilizing the SiEI. These findings enable rational design of new electrolyte additives and functional binders for the development of next generation LiBs.
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