The atomic behavior of Li ion in the cathode materials that determines LiBs performance is hardly characterized by transmission electron microscopy (TEM) owing to its weak electron-scattering power. In this sense, annular bright-field (ABF) STEM, in which the contrast has a low scaling rate with the atomic number, has been proven to be a robust technique for simultaneous imaging of light and heavy elements. However, it is very important to understand the damage mechanism of cathode materials by electron-beam irradiation in STEM and to develop this technique. In this study, we investigated the effect of electron-beam irradiation damage on the surface reaction layer and LiNi0.6Co0.2Mn0.2O2 material during STEM data acquisition. This electron-beam irradiation damage process is similar to the lattice reconstruction and chemical evolution caused by the charge-discharge cycle. Furthermore, based on the phase transition phenomenon by the electron-beam irradiation, it is examined whether the electron beam irradiation damage in the lattice structure substituted by Al and Ti affects the phase transition phenomenon.
