Li Plating/Stripping Reactions on Li6.6La3Ta0.4Zr1.6O12

Thursday, 17 October 2019: 10:40
Room 223 (The Hilton Atlanta)
M. Motoyama (Graduate School of Engineering, Nagoya University), Y. Tanaka, T. Yamamoto (Nagoya University), and Y. Iriyama (Graduate School of Engineering, Nagoya University)
Li7La3Zr2O12 (LLZ) is an attractive candidate for oxide solid electrolyte for various Li-metal-based batteries such as all-solid-state-Li battery, Li-S battery, and Li-air battery. This is because LLZ has a high shear modulus and a wide electrochemical stability window and high Li+ conductivity (can be 10−3 S cm−1 depending on dopant element) at room temperature. However, LLZ still cannot perfectly suppress short-circuiting during Li plating/stripping cycles. Although several approaches to suppress the short-circuiting phenomenon have been reported1, why the short-circuiting occurs during Li plating/stripping cycles on LLZ has not essentially been understood. This study applies an in-situ scanning-electron microscope (SEM) observation technique2 to the investigation on the Li plating/stripping reactions on Li6.6La3Zr1.6Ta0.4O12 (LLZT).

A LLZT plate (Toshima Manufacturing Co. Ltd.) with a thickness of 0.5 mm was used as the electrolyte1. A Cu current collector (CC) film was deposited on one side of a LLZT plate by pulsed laser deposition (PLD). A Li film with a thickness of 3 μm and a diameter of 9.0 mm was deposited on the other side of the LLZT plate as the counter electrode by vacuum evaporation. A fabricated Cu/LLZT/Li cell was sandwiched between Cu and brass plates. The Cu plate has a view port in the center. The cell was transferred into the SEM camber without exposure to the air. Li plating/stripping was conducted under galvanostatic conditions at room temperature during the SEM observation.

Figure 1shows the voltage transient during Li plating at 100 uA cm−2 on Cu-coated LLZT. Li does not only nucleate at grain boundaries but also on grain cores. After 450 seconds, the voltage drops to 0 V indicating the occurrence of short-circuiting. This result indicates that only a small number of the nucleation sites exist on LLZT surfaces whereby the local current density is supposed to increase. We will also discuss the detail of short-circuiting mechanism of LLZT.

Acknowledgement

The authors gratefully acknowledge JSPS 17H04894 for the financial supports

References

[1] Motoyama et al., J. Electrochem. Soc.,162, A7067 (2015).

[2] Yonemoto et al., J. Power Sources, 343, 207 (2017).