1651
(Invited) Self-Absorption Correction in X-Ray Fluorescence Imaging

Sunday, 29 May 2022: 11:00
West Meeting Room 218 (Vancouver Convention Center)
M. Ge, X. Huang, H. Yan (Brookhaven National Laboratory), D. Gursoy (Argonne National Laboratory), Y. Meng (Clemson University), J. Zhang, S. Ghose (Brookhaven National Laboratory), W. Chiu (University of Connecticut), K. Brinkman (Clemson University), and Y. Chu (Brookhaven National Laboratory)
The self-absorption problem in the x-ray fluorescence (XRF) imaging community is a long-lasting and grand challenge to achieve quantitative analysis. Accurate correction is of broad interest in many disciplines, including material science, environmental science, and biology. The researchers desire to obtain a 3D structure with accurate material compositions or trace element distributions from complex 3D specimens with multi-components. We will present a generalized absorption correction method, which works broadly for 2D and 3D imaging. With the developed method, we reveal internal 3D elemental composition in a mixed ionic-electronic conductor (MIEC), which has important applications in energy conversion and catalysis, whose material functionality is intimately tied to diffusion and phase-separation at grain boundaries. By performing accurate quantification of 3D concentration over an unprecedented number of grains (i.e. a total of 340 grains), we unveil deep insights on the complex phase transformation at the grain boundaries and the mechanistic model for producing the so-called emergent phases, which plays a critical role in achieving high transport properties of the MIEC material system.