Attenuated total reflection surface enhanced infrared absorption spectroscopy (ATR-SEIRAS) is highly sensitive to the interfacial region and can probe sub-monolayer adsorbates and species within ca. 10 nm of the electrode surface, which makes it valuable for studying interfacial processes. Our group demonstrated the application of ATR-SEIRAS to identify ORR products in nonaqueous M-O2 batteries, wherein a ZnSe prism internal reflection element (IRE) was utilised to extend the measurement range down to ca. 700 cm-1.1 While ZnSe offers enhanced optical properties over some conventional IREs, the lower wavenumber cut-off means that the sub-700 cm-1 vibrational frequencies of some superoxide and peroxide species and intermediates generated during ORR/OER cannot be observed. Recently, a micromachined Si wafer IRE has been developed to extend the measurement range of ATR-SEIRAS to well below 700 cm-1.2
In this work, we report ATR-SEIRAS investigations into the O2 electrochemistry and the potential dependent interfacial restructuring of 1-methyl-1-propylpyrrolidinium bis{(trifluoromethyl)sulfonyl}imide ([Pyrr13][TFSI]) utilising a thin-layer Au electrode on the micromachined Si wafer IRE to extend the measurement range towards the far-IR region. While the potential-dependent restructuring of the IL/Au electrode interface has been investigated by ATR-SEIRAS previously,3 the optical transmission of the Si wafer IRE used here reveals previously unreported changes in the 1000–500 cm-1 spectral region (Figure 1). We also discuss here how the redox couple of dissolved O2 strongly alters the double-layer restructuring, and the associated activation energy barriers, in the IL electrolyte. The ORR in the IL electrolyte in the presence of Li+ or Na+ cations is also explored, wherein the identification of sub-700cm-1 (su)peroxy intermediates/products, critical to understanding the overall mechanisms, is made possible using the Si wafer IRE.
References
- J. P. Vivek, N. G. Berry, J. Zou, R. J. Nichols, and L. J. Hardwick, J. Phys. Chem. C, 121, 19657–19667 (2017).
- T. A. Morhart, B. Unni, M. J. Lardner, and I. J. Burgess, Anal. Chem., 89, 11818–11824 (2017).
- K. Motobayashi, Y. Shibamura, and K. Ikeda, Electrochem. Commun., 100, 117–120 (2019).
Figure 1. Operando ATR-SEIRAS measurements of [Pyrr13][TFSI] (at a thin-layer Au electrode) at 0.9 V vs reference spectra at -2.7 V (dark blue and dark red spectra) at a) 1500-900 cm-1 and b) 860-500 cm-1. The Si wafer IRE (red spectrum) allows detection of [TFSI]- peaks below 1000 cm-1, which are not visible using the Si prism (light blue spectrum) due to the poor IR transmission in this region. Wafer spectra intensities are multiplied by a factor of 2 and the grey trace is an ex situ ATR-FTIR spectrum of the bulk IL.