H01 Poster Session

Wednesday, 1 June 2022: 18:00-20:00

West Ballroom B/C/D (Vancouver Convention Center)

1331

Power Cycling Test Failure Analysis of SiC Mosfet Devices

M. KIM (Pusan National University), I. Kang, J. H. SEO (Korea Electrotechnology Research Institute (KERI)), T. E. Hong (Korea Basic Science Institute (KBSI)), J. H. Jeong, D. Yoo, and H. J. Lee (Pusan National University)

1332

Probing the Density of States of Organic and Perovskite Semiconductors By Energy-Resolved Electrochemical Impedance Spectroscopy

W. F. M. van Geel and R. A. J. Janssen (Eindhoven University of Technology)

1333

Control of Hydrogen Concentration in Ingazno Thin Film Using Cryopumping System

S. Jung, T. Sung, S. Lee (Yonsei university), and J. Y. Kwon (Yonsei University)

1334

Vertical Oxide Channel Thin Film Transistor for Ultra-High-Resolution Display

S. Lee, T. Sung (Yonsei university), M. K. Song, and J. Y. Kwon (Yonsei University)

See more of: H01: Wide-Bandgap Semiconductor Materials and Devices 23
See more of: Electronic and Photonic Devices and Systems

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