In our approach, a field-effect transistor with ultrathin ZnO semiconductor (3-5 nm) is fabricated, the heart of which is a metal-insulator-semiconductor (MIS) stack. A high-dielectric-constant material (HfO2) is used as the insulator to realize low-voltage tunability of the device. The ZnO layer of the device functions as the working electrode (WE) for electrochemical reactions. By applying a back gate voltage to this MIS field-effect transistor, charge carriers are electrostatically induced and the ZnO band edges shift at the front face of the ZnO in contact with electrolyte. These effects can be exploited to manipulate the charge transfer kinetics on the ZnO electrode at a given electrode potential. We demonstrate this by focusing on outer-sphere redox chemistry. In order to eliminate mass transfer effects, microfluidic flow cells are coupled to the ZnO devices. Steady state kinetic analysis is carried out to extract the electron transfer rate constant of the redox process as a function of both electrochemical and back gate potentials. The heterogeneous electron transfer rate can be tuned by over an order of magnitude using the back gate voltage. The work demonstrates that a back gate provides another degree of freedom in determining electrochemical reaction kinetics at ultrathin semiconductor working electrodes. The method also opens possibilities for control over a wider range of semiconductor electrochemistry, such as electrocatalytic reactions.