In this study, electrocatalyst accelerated stress tests (ASTs) were performed on the MEAs prepared using MPLs with different density and configuration of cracks. The ASTs had a total of 90 000 cycles, with electrochemical characterization performed at beginning of life, after 10 000, 30 000, 60 000 and 90 000 (end of life). Each cycle consisted of potential cycling between 0.6 V to 0.9 V, with 3 seconds hold time for each. The effect of cracks in MPLs on electrocatalyst degradation was evaluated in both nitrogen (non-reactive) and air (reactive) gas environments at 100% relative humidity, 80oC, and 150 kPa backpressure. In-situ electrochemical characterization and extensive physical characterization was performed to understand the subtle differences in electrocatalyst degradation correlated to the use of crack-free and cracked MPLs. In particular, micro-X-ray fluorescence (XRF) map of identical locations before and after the AST were employed to study in-plane movement of Pt loading over the course of AST. Micro x-ray diffraction (XRD) maps were collected on the MEAs to correlate Pt loadings to Pt particle size distribution.
The polarization curves, Tafel plots, and electrochemical surface area (ECSA) for MEAs with and without cracks in the MPLs all demonstrated similar trends in the cells’ durability, revealing that cracks in the MPLs do not significantly affect the performance of the cell at the beginning and also at the end of life. However, the XRF identical location maps showed significant in-plane movement of Pt over the course of the AST: decrease of Pt loading in the mapped region closer to the gas inlet and increase of Pt loading closer to the gas outlet. Moreover, higher degree of cracking was observed at the cell outlet after the AST, indicating that the catalyst layer mechanical aging is not homogeneous.
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