Wednesday, 12 October 2022: 08:40
Room 312 (The Hilton Atlanta)
The traditional gas sensors based on metal oxides (MO) have the advantage of being relatively cheap, they exhibit simple designs with straightforward production processes, and are resistant to harsh operating environments. Generally, one of the challenges with these devices remains their poor selectivity. Metal-organic frameworks (MOFs) are a developing class of tunable electronic nanomaterials which combine the advantages of the long-range order of inorganic conductors with the synthetic flexibility of organic semiconductors. More importantly, they have the potential to overcome many of the challenges of selectivity that limit other sensor materials due to the mechanisms involved in the charge transfer processes in these MOF materials which lead to a change in band structures akin to those in the metal-oxide semiconductor. In contrast to bulk MOFs which exist as loosely packed powders, the Hong Kong University of Science & Technology HKUST -1 MOF is amenable to compact thin film growth by quasi liquid epitaxial growth and is suitable for solid-state device applications. Therefore, dense, compact surface anchored metal-organic framework (SURMOF) HKUST-1 films could operate well as gas sensors. In this talk, I will demonstrate that by using the microwaves-based detection technique known as Broadband dielectric spectroscopy (BDS), we can rapidly interrogate a dynamic range of material characteristics such as polarizability, phase, electrical conductivity, etc. Specifically, the chemical-induced changes to microwave signal propagation characteristics (i.e., S-parameters) enabled us to characterize the detection of aliphatic alcohol (methanol, ethanol, and 2-propanol) vapors using TCNQ-doped HKUST-1 metal-organic-framework films as the sensing material, at temperatures under 100 °C. Using this technique, we describe some of physical processes in the Volatile organic compound (VOC) detection, with MOFs, that are inaccessible with the traditional coulometric (i.e., resistance-based) measurements.