Y. Wang, H. Dong, N. Katyal, G. Henkelman (The University of Texas at Austin), J. Watt (Center for Integrated Nanotechnologies, Los Alamos National Laboratory), and D. Mitlin (The University of Texas at Austin)

S. P. Vanam (Indian Institute of Science) and P. Barpanda (Indian Institute of Science Bangalore, Helmholtz Institut Ulm)

P. W. Jaschin and E. Wachsman (University of Maryland)

L. Hartmann (Technical University of Munich, Dalhousie University), J. Deshmukh, L. Zhang, S. Büchele, and M. Metzger (Dalhousie University)

J. Ge, L. Fan (Hunan University), A. M. Rao (Clemson University), J. Zhou (Central South University), and B. Lu (Hunan University)

J. Drews (German Aerospace Center DLR, Helmholtz Institute Ulm HIU), R. R. Maça (CIDETEC Energy Storage), L. Wang (Karlsruhe Institute of Technology KIT, Helmholtz Institute Ulm HIU), J. Wiedemann (German Aerospace Center DLR, Helmholtz Institute Ulm HIU), J. A. Blázquez (CIDETEC Energy Storage), Z. Zhao-Karger (Helmholtz Institute Ulm HIU, Karlsruhe Institute of Technology KIT), M. Fichtner (Helmholtz Institute Ulm HIU, Karlsruhe Institute of Technology KIT), T. Danner (German Aerospace Center DLR, Helmholtz Institute Ulm HIU), and A. Latz (Helmholtz Institute Ulm HIU, German Aerospace Center DLR)

W. He and Z. Yue (South Dakota State University)

L. Ma (University of North Carolina at Charlotte), J. Vatamanu (United States Army Research Laboratory), N. T. Hahn (Sandia National Laboratories), T. Pollard, M. Schroeder (United States Army Research Laboratory), V. Petkov (Central Michigan University), M. Ding (United States Army Research Laboratory), Y. Ren (Argonne National Laboratory, Advanced Photon Source), C. Luo (George Mason University), J. L. Allen (United States Army Research Laboratory), C. Wang (University of Maryland), and K. Xu (US Army Research Laboratory)

A. Mistry, I. D. Johnson, B. J. Ingram, and V. Srinivasan (Argonne National Laboratory)

M. Romio, Y. Surace (AIT - Austrian Institute of Technology GmbH), N. Eshraghi (Austrian Institute of Technology GmbH (AIT)), B. Herzog, B. Eckmann (Federal Institute of Metrology METAS), D. M. Cupid (Austrian Institute of Technology), J. Hoffmann (Federal Institute of Metrology METAS), and M. Jahn (AIT Austrian Institute of Technology GmbH)