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Rapid Thermal Anneal Process for Indium-Tin-Oxide Electrode Formed on Chemically Strengthened Glass
Tuesday, May 14, 2013
Osgoode Ballroom, Lower Concourse Level (Sheraton)
Chan-Hwa Hong
,
Electronics and Telecommunications Research Institute
Jae-Heon Shin
,
Electronics and Telecommunications Research Institute
Kyung Hyun Kim
,
Electronics and Telecommunications Research Institute
Nae-Man Park
,
Electronics and Telecommunications Research Institute
Bosul Kim
,
Electronics and Telecommunications Research Institute
Dong-Ho Kang
,
Novatech Co., Ltd
Sun-Young Ryou
,
Sun Moon University
Byeong-Kwon Ju
,
Korea University
Woo-Seok Cheong
,
Electronics and Telecommunications Research Institute, Daejeon, South Korea
