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Towards Robust and Reliable SOEC Cells and Stacks: Understanding Degradation Phenomena Occurring Under High Current Densities
Towards Robust and Reliable SOEC Cells and Stacks: Understanding Degradation Phenomena Occurring Under High Current Densities
Wednesday, May 15, 2013: 10:40
Kent, Second Floor (Sheraton)
Ragnar Kiebach, Dr.
,
Technical University of Denmark (DTU) , Department of Energy Storage and Conversion, Roskilde, Denmark
Ming Chen
,
Technical University of Denmark (DTU) , Department of Energy Storage and Conversion
Xiufu Sun
,
Technical University of Denmark (DTU) , Department of Energy Storage and Conversion
Jens Høgh
,
Technical University of Denmark (DTU) , Department of Energy Storage and Conversion
Yi-Lin Liu
,
Technical University of Denmark (DTU) , Department of Energy Storage and Conversion
Per Hjalmarrson
,
Technical University of Denmark (DTU) , Department of Energy Storage and Conversion
Janet Jonna Bentzen
,
Technical University of Denmark (DTU) , Department of Energy Storage and Conversion
Jacob Bowen
,
Technical University of Denmark (DTU) , Department of Energy Storage and Conversion
Anne Hauch
,
Technical University of Denmark (DTU) , Department of Energy Storage and Conversion
Karen Brodersen
,
Technical University of Denmark (DTU) , Department of Energy Storage and Conversion
Karsten Argersted
,
Technical University of Denmark (DTU) , Department of Energy Storage and Conversion
Sune Dalgaard Ebbesen
,
Technical University of Denmark (DTU) , Department of Energy Storage and Conversion
Peter Vang Hendriksen
,
Technical University of Denmark (DTU) , Department of Energy Storage and Conversion
Jens Ulrick Nielsen
,
Topsoe Full Cell
Abstract:
- B5-0470 (6.3KB) - Abstract Text