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Towards Robust and Reliable SOEC  Cells and Stacks: Understanding Degradation Phenomena Occurring Under High Current Densities

Wednesday, May 15, 2013: 10:40
Kent, Second Floor (Sheraton)
Ragnar Kiebach, Dr. , Technical University of Denmark (DTU) , Department of Energy Storage and Conversion, Roskilde, Denmark
Ming Chen , Technical University of Denmark (DTU) , Department of Energy Storage and Conversion
Xiufu Sun , Technical University of Denmark (DTU) , Department of Energy Storage and Conversion
Jens Høgh , Technical University of Denmark (DTU) , Department of Energy Storage and Conversion
Yi-Lin Liu , Technical University of Denmark (DTU) , Department of Energy Storage and Conversion
Per Hjalmarrson , Technical University of Denmark (DTU) , Department of Energy Storage and Conversion
Janet Jonna Bentzen , Technical University of Denmark (DTU) , Department of Energy Storage and Conversion
Jacob Bowen , Technical University of Denmark (DTU) , Department of Energy Storage and Conversion
Anne Hauch , Technical University of Denmark (DTU) , Department of Energy Storage and Conversion
Karen Brodersen , Technical University of Denmark (DTU) , Department of Energy Storage and Conversion
Karsten Argersted , Technical University of Denmark (DTU) , Department of Energy Storage and Conversion
Sune Dalgaard Ebbesen , Technical University of Denmark (DTU) , Department of Energy Storage and Conversion
Peter Vang Hendriksen , Technical University of Denmark (DTU) , Department of Energy Storage and Conversion
Jens Ulrick Nielsen , Topsoe Full Cell

Abstract: