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Leakage Current Analysis Depends on Grain Size Variation in Zinc Oxide Thin Film Transistor

Tuesday, October 29, 2013
Grand Ballroom, Tower 2, Grand Ballroom Level (Hilton San Francisco Union Square)
Hojoong Kim , Yonsei University, Seoul, South Korea
Suk Yang , Yonsei University
Kyung Park, Ph.D , Yonsei University
Parthiban Shanmugam, Ph.D , Yonsei University
Jang Yeon Kwon, Ph.D , Yonsei University

Abstract:

  • A1-0076 (316.7KB) - Abstract Text
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