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In-Situ Scanning Probe Microscopy for Observing Electrode Surfaces Under Operating Conditions

Wednesday, October 30, 2013: 16:20
Yosemite A, Tower 2, Ballroom Level (Hilton San Francisco Union Square)
Eric Kreidler , Honda Research Institute, Inc., Columbus, OH
Qingmin Xu , Honda Research Institute, Inc.
Kaoru Omichi , Honda Research Institute, Inc.
Christopher Brooks , Honda Research Institute, Inc.

Abstract:

  • B2-0456 (4030.7KB) - Abstract Text
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