Ionic Conductivity of Eusz Thin Films

In this work, we deposited Eu doped ZrO₂ thin films by ultrasonic spray pyrolysis method, using zirconium acetilacetonate and europium acetilacetonate as precursors and atmospheric air as carrier gas in function of dopant molarities. The structure, morphology, chemical composition and dielectric properties were characterized by X-ray diffraction (XRD), Atomic force microscopy (AFM), X-ray Photoelectron spectroscopy (XPS), and Impedance spectroscopy (IS).  The XRD technique showed that all the peaks correspond to a cubic structure.