Ionic Conductivity of Eusz Thin Films

Tuesday, 7 October 2014
Expo Center, 1st Floor, Center and Right Foyers (Moon Palace Resort)
I. Paredes, E. B. Ramírez (Universidad Autónoma de la Ciudad de México), and J. C. Alonso (Instituto de Investigaciones en Materiales - Universidad Nacional Autónoma de México)
In this work, we deposited Eu doped ZrO2 thin films by ultrasonic spray pyrolysis method, using zirconium acetilacetonate and europium acetilacetonate as precursors and atmospheric air as carrier gas in function of dopant molarities. The structure, morphology, chemical composition and dielectric properties were characterized by X-ray diffraction (XRD), Atomic force microscopy (AFM), X-ray Photoelectron spectroscopy (XPS), and Impedance spectroscopy (IS).  The XRD technique showed that all the peaks correspond to a cubic structure.