Analysis of Patterned Defects on Graphene Using Micro-Raman Spectroscopy and Liquid Crystals

Wednesday, 27 May 2015: 12:10
Conference Room 4C (Hilton Chicago)
G. Yang, S. Oh, and J. Kim (Korea University)
Graphene has been used in various applications such as light-emitting diodes, solar cells, transistors, and chemical sensors because of its intriguing properties. Since defects in graphene can affect its intrinsic properties, defect characterizations in graphene are crucial. Micro-Raman spectroscopy has been considered one of the powerful and non-destructive techniques to analyze fundamental properties of graphene. Since fast characterization of large-area graphene is critical for its commercialization, large-area graphene was analyzed using liquid crystal with polarized optical microscopy at different temperatures.

 Chemical-vapor-deposited graphene was transferred onto pre-patterned SiO2/Si substrate by using conventional wet-transfer method. Defects were intentionally generated by oxygen plasma for various treatment times. The details of our experiments and results will be discussed in the meeting.