Physics, Modeling, Contact Effects

Wednesday, 27 May 2015: 14:00-16:00
Conference Room 4L (Hilton Chicago)
Jiri Pfleger
(Invited) Disentangling the Effects of Gated-Contacts on Transconductance in Organic FETs
E. Bittle (NIST, Wake Forest University), J. I. Basham (NIST, Penn State), T. N. Jackson (Penn State), O. D. Jurchescu (Wake Forest University), and D. J. Gundlach (NIST)
(Invited) Charge-Based Modelling of the Channel Current in Organic Field Effect Transistors Considering Injection Effects
F. Hain (Technische Hochschule Mittelhessen, Universitat Rovira i Virgili), C. Lammers, F. Hosenfeld (Technische Hochschule Mittelhessen), H. Klauk, U. Zschieschang (Max-Planck-Institute for Solid State Research), B. Iniguez (Universitat Rovira i Virgili), and A. Kloes (Technische Hochschule Mittelhessen)
Concluding Remarks