A. R. Harutyunyan (Honda Research Institute USA Inc)

S. Maruyama (Advanced Industrial Science and Technology, The University of Tokyo), R. Xiang, H. An, Y. Qian (The University of Tokyo), K. Cui (Massachusetts Institute of Technology, The University of Tokyo), A. Kumamoto, T. Inoue, S. Chiashi, and Y. Ikuhara (The University of Tokyo)

Y. Li and F. Yang (Peking University)

M. Zheng (National Institute of Standards and Technology)

Y. Zhao, J. Clar, L. Li, J. Xu, T. Yuan, J. C. J. Bonzongo, and K. J. Ziegler (University of Florida)

J. A. Fagan (National Institute of Standards and Technology)

S. Cambre, J. Defillet, and W. Wenseleers (University of Antwerp)

Y. Zhao, J. Clar, J. Xu, J. C. J. Bonzongo, and K. J. Ziegler (University of Florida)