J. Coyle (University of Colorado-Boulder), C. A. Apblett (University of New Mexico), and C. R. Stoldt (University of Colorado-Boulder)

Y. Cui (Karlsruher Institut of Technology), M. Rohde, T. L. Reichmann (Karlsruhe Institute of Technology, IAM-AWP), M. M. Mahmoud (Karlsruhe Institute of Technology), C. Ziebert, and H. J. Seifert (Karlsruhe Institute of Technology, IAM-AWP)

A. Y. H. Chang and P. P. J. Chu (Department of Chemistry, National Central University)

K. Mckelvey, M. Edwards (University of Utah), D. Ruzmetov (NIST), A. Kolmakov (NIST Gaithersburg), N. Ware (Sandia National Labs), F. El Gabaly, A. A. Talin (Sandia National Laboratories), B. Dunn (University of California - Los Angeles), and H. S. White (University of Utah)

Y. Ji and V. Srinivasan (Lawrence Berkeley National Laboratory)

Y. S. Choi (Seoul National University, Korea Institute of Science and Technology), K. H. Oh (Seoul National University), Y. W. Cho, and Y. S. Lee (Korea Institute of Science and Technology)

S. Sasaki, A. Suzuki, and T. Jimbo (Institute of Semiconductor and Electronics Technologies, ULVAC, Inc.)

Y. C. Jung (Department of Chemical Engineering, Hanyang University), D. H. Kim, W. C. Shin, M. Ue (Battery R&D Center, Samsung SDI), and D. W. Kim (Department of Chemical Engineering, Hanyang University)

I. Villaluenga (Lawrence Berkeley National Laboratory), K. Wujcik (University of California, Berkeley), W. Tong, D. Devaux (Lawrence Berkeley National Laboratory), D. H. C. Wong (University of North Carolina at Chapel Hill), J. M. DeSimone (North Carolina State University), and N. P. Balsara (Lawrence Berkeley National Laboratory)

E. Yi, W. Wang, and R. Laine (University of Michigan)