Usually, photocorrosion is interpreted on the basis of energy schemes, comparing the quasi-Fermi levels of minority carriers to the corrosion potentials of the photoelectrode . However, the competition between the pure redox process of water splitting and photoelectrode dissolution/passivation is mainly determined by kinetic parameters .
In this study, we use a physics-based model to quantify the effect of photocorrosion phenomenon on the global performance loss of the photoelectrochemical device. The studied device is composed of different catalyst covered semiconductors, immersed in a liquid electrolyte. The catalyst layer is considered a nanoporous media, the solid phase being composed of a supporting structure and catalyst particles.
The simulation results highlight the practical limitation of using thermodynamic calculations for the investigation of photoelectrochemical devices durability, and how irradiation, mass transport, and kinetic properties can impact the stability of the photoelectrode/electrolyte interface.
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