Unlike stacked graphene, semiconducting 2D transition metal dichalcogenides (TMDCs) have diffuse interlayer d-orbital overlap. To enhance interlayer electronic coupling in TMDCs, we apply an interlayer directed E-field, inducing electron-hole dissociation. Our lab [5] and others [6] measure that stacked WSe2 TMD devices can have both IQE >50% and fast (<50 ps) picosecond electron escape times. Using a first-principle kinetic master equation, our methods analytically extracts both the E-field-dependent interlayer escape velocity and rate-limiting exciton dissociation time. Remarkably our photocurrent response function produces the same E-field-dependent electronic escape and dissociation rates for both the optical and PC addressed ultrafast measurements. As confirmation, the resulting ratio of the electronic rates accurately matches our overall WSe2 device IQE in the intensity limit of zero Auger recombination. Thus through time-space resolved microscopy, we now obtain a timeline selective to the interlayer electronic dynamics of TMDCs and tBLG van der Waals materials. We show how this novel scanning microscopy approach, combines ultrafast photocurrent and transient absorption to identify new long-lived and metastable interlayer electronic states in emerging twisted and stacked 2D materials and devices.
References
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