However, it is still challenging to grow wafer-sized, highly uniform and strictly monolayer TMDCs continuous film through the conventional chemical vapor deposition (CVD) due to the uncontrollable growth kinetics. The evaporation rates and amounts of the heated precursors are uncontrollable because the saturation vapor pressure of the precursor is exponentially dependent on the temperature inside the furnace. The sulfurized film is thus consisted of a mixture of monolayer, bilayer and multiple layers of TMDCs. The film with such unreproducible quality is not applicable for real industrial applications.
In this work, we provide a self-limiting growth strategy based on modified CVD process to prepare the wafer-sized monolayer TMDCs. Theoretical simulations were performed to understand the fundamental thermodynamically mechanism of the strictly monolayer growth. The property-variation in TMDCs due to difference in electronic structure between different layers of TMDCs can be significantly reduced based on this new approach. The following figure indicates that the PL spectra detected from different spots (spot 1 to 5) of the WS2 film. All spectra measured from the 4'' wafer-sized sample show characteristics unique to monolayer WS2. This poses a reliable route for the growth of large-area monolayer TMDCs, which is essential for their reliable and robust applications in nanoelectronic devices.