Monday, 10 October 2022: 08:00-12:30
Room 311 (The Hilton Atlanta)
11:30
Enabling High Aspect Ratio 3D NAND Scaling through Deposition and Etch Co-Optimization (DECO)
M. Shen, J. Hoang (Lam Research Corporation), H. Chi (Lam Research Corp.), A. Routzahn (Lam Research Corporation), J. Church, P. S. Subramonium, R. Puthenkovilakam, S. R. Reddy, S. Bhadauriya, S. Roberts (Lam Research Corp.), T. Lill (Lam Research Corporation), and G. Kamarthy (Lam Research Corp.)