Crystalline films of K2CuFe(CN)6 were characterized by X-ray diffraction (XRD), atomic force microscopy (AFM) and scanning electron microscopy (SEM), X-ray photoelectron spectroscopy to confirm crystallinity, elemental composition and valence states. While the structural properties are understood, little is known about the thermoelectric application potential of these Prussian Blue Analogues. This presentation will report our findings and discuss our electrical characterization measurements utilizing Hall effect measurements to elucidate electrical properties such as carrier concentration, resistivity, mobility, Hall coefficient and an assessment for possible future applications. In addition, a complete thermoelectric characterization is being performed by employing a Lab-on-a-Chip test method, which enables deposition of metal-organic framework compounds through a mask for simultaneous measurements of the Seebeck coefficient and the thermal conductivity.