H. Shima, M. Takahashi, Y. Naitoh, and H. Akinaga (AIST)

J. C. Gonzalez-Rosillo and J. L. M. Rupp (Massachusetts Institute of Technology)

S. M. Jin, K. H. Kwon, D. W. Kim, H. J. Kim, H. M. Yang, J. Y. Kim, and J. G. Park (Hanyang University)

P. R. Shrestha (National Institute of Standards and Technology, Theiss Research), D. M. Nminibapiel (National Institute of Standards and Technology (NIST)), D. Veksler (The Aerospace Corporation), J. P. Campbell (National Institute of Standards and Technology), J. T. Ryan (National Institute of Standards and Technology (NIST)), H. Baumgart (Old Dominion University, ECE Department), and K. P. Cheung (National Institute of Standards and Technology (NIST))