EIS Study on SOFC Short Stack

SOFCs are a strong potential technology for increasing energy efficiency and reducing CO2 emissions. One of the most significant bottleneck for the development of this technology is stack duration. Demonstration activity all around Europe is showing that efficiency decreases due to cells degradation caused by delamination, reduction of active site, increase of component resistance, etc. With the aim of detecting degradation causes the impedance technology technique (EIS) was applied to SOFC with interesting results. This study presents the application of EIS directly to stack performance. Experimental results and analysis is reported using equivalent circuit study and distribution of relation time (DRT) with the aim of individuate degradation causes.