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(Invited) High Sensitivity Optical Characterization of Thin Films with Embedded Si Nanocrystals

Monday, May 13, 2013: 11:20
Conference Room F, Mezzanine Level (Sheraton)
Peter Petrik, PhD , Institute for Technical Physics and Materials Science (MFA), Budapest, Hungary
Emil Agocs , Institute for Technical Physics and Materials Science (MFA)

Abstract: