Fabrication and Characterization I

Monday, May 13, 2013: 10:00-12:00
Conference Room F, Mezzanine Level (Sheraton)
Chair:
David J. Lockwood
10:40
782
(Invited) Nanocrystalline Approaches to Electronic Materials Using Subsecond Thermal Processing
Wolfgang Skorupa, Dr.-Ing., Helmholtz-Zentrum Dresden Rossendorf
11:20
783
(Invited) High Sensitivity Optical Characterization of Thin Films with Embedded Si Nanocrystals
Peter Petrik, PhD, Institute for Technical Physics and Materials Science (MFA); Emil Agocs, Institute for Technical Physics and Materials Science (MFA)