845
Organic Semiconductor Valence Band Alignment Determined by Internal Photoemission Spectroscopy
Wednesday, May 15, 2013: 16:25
Willow Ballroom Center, Mezzanine Level (Sheraton)
Wei Li
,
National Institute of Standards and Technology
Xuelei Liang
,
Peking University, Beijing, China
James Basham
,
National Institute of Standards and Technology
Thomas N. Jackson
,
The Pennsylvania State University
Kun Xu
,
National Institute of Standards and Technology
Qin Zhang
,
National Institute of Standards and Technology
Oleg Kirillov
,
National Institute of Standards and Technology
Rusen Yan
,
University of Notre Dame, Notre Dame, IN, USA
Curt A. Richter
,
National Institute of Standards and Technology
Nhan V. Nguyen
,
National Institute of Standards and Technology
David J. Gundlach
,
National Institute of Standards and Technology, Gaithersburg, MD
