Organic Photovoltaic Device Physics

Wednesday, May 15, 2013: 13:30-17:30
Willow Ballroom Center, Mezzanine Level (Sheraton)
Chairs:
Oana D. Jurchescu and Michael Chabinyc, PhD
14:00
840
Physics of Organic Diode Operation :Application to Solar Cell and Photodiodes
Raphaël Clerc, Laboratoire Hubert Curien (UMR 5516 CNRS)
14:20
841
Loss Mechanisms in Polymer-Fullerene Solar Cells
Carsten Deibel, Experimental Physics VI, Julius-Maximilian-University of Würzburg, Germany; Alexander Foertig, Experimental Physics VI, Julius-Maximilian-University of Würzburg, Germany; Vladimir Dyakonov, Experimental Physics VI, Julius-Maximilian-University of Würzburg, Germany
14:50
Break
15:05
842
Nanostructured Electrodes and Photoactive Layers for Efficient, Stable and Flexible Organic Photovoltaic Devices
Peyman Servati, University of British Columbia; Bobak Gholamkhass, University of British Columbia; Saeid Soltanian, University of British Columbia; Rowshan Rahmanian, University of British Columbia; Nima Mohseni Kiasari, University of British Columbia; Zenan Jiang, University of British Columbia; Frank K. Ko, University of British Columbia; Jun Shen, Chongqing Institute of Greent and Intelligent Technology; Abdullah I. Aljaafari, King Faisal University
15:35
843
A Cu-Based Alloyed Ohmic Contact System on Multi-Junction Solar Cell
Ching-Hsiang Hsu, PHD student, National Chiao-Tung University; Edward Yi Chang, PhD, National Chiao Tung University
15:55
844
Plasmonic Photoinjection Spectroscopy: Unraveling Charge Carrier Injection Directly in Organic Electronic Devices
Noel Giebink, Penn State University; Rijul Dhanker, Penn State University
16:25
845
Organic Semiconductor Valence Band Alignment Determined by Internal Photoemission Spectroscopy
Wei Li, National Institute of Standards and Technology; Xuelei Liang, Peking University, Beijing, China; James Basham, National Institute of Standards and Technology; Thomas N. Jackson, The Pennsylvania State University; Kun Xu, National Institute of Standards and Technology; Qin Zhang, National Institute of Standards and Technology; Oleg Kirillov, National Institute of Standards and Technology; Rusen Yan, University of Notre Dame, Notre Dame, IN, USA; Curt A. Richter, National Institute of Standards and Technology; Nhan V. Nguyen, National Institute of Standards and Technology; David J. Gundlach, National Institute of Standards and Technology
16:45
Concluding Remarks by Professor M. Jamal Deen