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Analysis of Bias-Stress-Induced Charge Trap in Organic Transistors

Tuesday, May 14, 2013: 15:45
Willow Ballroom Center, Mezzanine Level (Sheraton)
Kilwon Cho , Pohang University of Science and Technology (POSTECH), Pohang, South Korea

Abstract:

See more of: Modeling, Charge Transport, and Trapping in Organic Semiconductor Devices
See more of: E4: Organic Semiconductor Materials, Devices, and Processing 4
See more of: Dielectric and Semiconductor Materials, Devices, and Processing
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