2177
Refined Characterization Up to Millimeter Waves of Ferroelectric KTN Thin Film for Efficient Integrated Tunable Devices
Refined Characterization Up to Millimeter Waves of Ferroelectric KTN Thin Film for Efficient Integrated Tunable Devices
Wednesday, October 30, 2013: 09:00
Union Square 22, Tower 3, 4th Floor (Hilton San Francisco Union Square)
Abstract:
- E10-2177 (252.3KB) - Abstract Text