2177
		Refined Characterization Up to Millimeter Waves of Ferroelectric KTN Thin Film for Efficient Integrated Tunable Devices
	
					
	
	Refined Characterization Up to Millimeter Waves of Ferroelectric KTN Thin Film for Efficient Integrated Tunable Devices
	Wednesday, October 30, 2013: 09:00
	Union Square 22, Tower 3, 4th Floor (Hilton San Francisco Union Square)
	
	
	
	Abstract:
- E10-2177 (252.3KB) - Abstract Text
