1915
Reliability of GaN Electronics: Novel Electrical Result

Tuesday, October 29, 2013: 10:10
Continental 9, Tower 3, Ballroom Level (Hilton San Francisco Union Square)
Martin Kuball , Tyndall Avenue, University of Bristol, Bristol, United Kingdom

Abstract:

See more of: Power Device Reliability 1
See more of: E3: GaN and SiC Power Technologies 3
See more of: Dielectric and Semiconductor Materials, Devices, and Processing
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