Power Device Reliability 1

Tuesday, October 29, 2013: 10:10-12:10
Continental 9, Tower 3, Ballroom Level (Hilton San Francisco Union Square)
Chairs:
Aris Christou and Mietek Bakowski
10:10
Reliability of GaN Electronics: Novel Electrical Result
Martin Kuball, University of Bristol
10:30
GaN-Based Power HEMTs: Parasitic, Reliability and High Field Issues
Gaudenzio Meneghesso, Full Professor, University of Padova; Matteo Meneghini, PhD, University of Padova; Davide Bisi, University of Padova; Riccardo Silvestri, Master, University of Padova; Alberto Zanandrea, Master, University of Padova; Oliver Hilt, Dr., Leibniz-Institut fuer Hoechstfrequenztechnik; Eldad Bahat-Treidel, Dr., Leibniz-Institut fuer Hoechstfrequenztechnik; F. Brunner, Leibniz-Institut fuer Hoechstfrequenztechnik; A. Knauer, Leibniz-Institut fuer Hoechstfrequenztechnik; Joachim Wuerfl, Dr., Leibniz-Institut fuer Hoechstfrequenztechnik; Enrico Zanoni, Full Professor, University of Padova
10:50
The Effects of Defects on the Breakdown Voltage of GaN High Power Electronic Devices
Kenneth A. Jones, Army Research Lab; M. A. Derenge, Army Research Lab; R. P. Tompkins, Army Research Lab; K. W. Kirchner, Army Research Lab; J. Leach, Kyma Technologies; P. Suvarna, CNSE, SUNY-Albany; F. Shahedipour, CNSE, SUNY-Albany
11:10
True Figure of Merit (FOM) of a Power Semiconductor Switch
Krishna Shenai, Argonne National Laboratory
11:30
Progress in SiC MOSFET Reliability
David R. Hughart, Sandia National Laboratories; Jack D. Flicker, Sandia National Laboratories; Sandeepan DasGupta, Sandia National Laboratories; Stan Atcitty, Sandia National Laboratories; Robert J. Kaplar, Sandia National Laboratories; Matthew J. Marinella, Sandia National Laboratories
11:50
Reliability of GaN HEMTs: Electrical and Radiation-Induced Failure Mechanism
Travis J Anderson, Naval Research Laboratory; Andrew D Koehler, Naval Research Laboratory; Marko J Tadjer, Naval Research Laboratory; Karl D Hobart, Naval Research Laboratory; Petra Specht, University of California, Berkeley; Matthew Porter, Naval Postgradute School; Todd R Weatherford, Naval Postgradute School; Brad Weaver, Naval Research Laboratory; Jennifer K. Hite, Naval Research Laboratory; Fritz J Kub, Naval Research Laboratory